FACULTY OF ENGINEERING
CHEMICAL ENGINEERING
Course Name   ADVANCED ANALYSIS TECHNIQUES
Semester Course Code Theoretical / Practice time ECTS
6 1216615 2,00 / 0,00 5,00
Course Degree Bachelor's degree
Course Language Turkish
Format of Delivery: Face to Face
Course Coordinator Assoc. Prof. Dr. Mahmut KUŞ
Coordinator e-mail mahmutkus1 gmail.com
Instructors
Asistant Instructors
Course Objectives Many developments on analysis tecniques are achieved by time. Teaching of such analysis tecniques is very imprtant to increase the skill of students on analysis of pre materials, semi products, final products and procces control. In this lecture it is aimed to present the topics as listed below.
Basic Sciences Engineering Scinces Social Sciences Educational Sciences Artistic sciences Medical Science Agricultural sciences
50 50 0 0 0 0 0
Course Learning Methods and Techniquies
The course is based on mutual deion of the subject, homeworks, and discussions.
Week Course Content Resource
1 Principles of Atomic Force Microscopy and Scanning Probe Microscopy Peter Eato, Paul West, Atomic Force Microscopy, Oxford Un., 2010, 978-0-19-957045-4
2 Intermolecular interactions, Van der Waals, London Forces etc Peter Eato, Paul West, Atomic Force Microscopy, Oxford Un., 2010, 978-0-19-957045-4
3 Conductiviy Peter Eato, Paul West, Atomic Force Microscopy, Oxford Un., 2010, 978-0-19-957045-4
4 Conductor, semi-conductor and insulatır materials Peter Eato, Paul West, Atomic Force Microscopy, Oxford Un., 2010, 978-0-19-957045-4
5 Definition of laser radiation Peter Eato, Paul West, Atomic Force Microscopy, Oxford Un., 2010, 978-0-19-957045-4
6 Diode array detectors Peter Eato, Paul West, Atomic Force Microscopy, Oxford Un., 2010, 978-0-19-957045-4
7 Tips Peter Eato, Paul West, Atomic Force Microscopy, Oxford Un., 2010, 978-0-19-957045-4
8 Midterm Exam
9 Scanning Electron Microscopy Ray F. Egerton, Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM, Springer, 2005, 978-0-387-26016-7
10 Cathode tubes Ray F. Egerton, Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM, Springer, 2005, 978-0-387-26016-7
11 Material electron intercations Ray F. Egerton, Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM, Springer, 2005, 978-0-387-26016-7
12 Vacuum systems Ray F. Egerton, Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM, Springer, 2005, 978-0-387-26016-7
13 Mechanic pumps Ray F. Egerton, Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM, Springer, 2005, 978-0-387-26016-7
14 Turbomolecular pums Ray F. Egerton, Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM, Springer, 2005, 978-0-387-26016-7
15 Final Exam
Assesment Criteria   Mid-term exam Final exam
  Quantity Percentage Quantity Percentage  
Term Studies : - - - -
Attendance / Participation : - - - -
Practical Exam : - - - -
Special Course Exam : - - - -
Quiz : - - - -
Homework : - - - -
Presentations and Seminars : - - - -
Projects : - - - -
Workshop / Laboratory Applications : - - - -
Case studies : - - - -
Field Studies : - - - -
Clinical Studies : - - - -
Other Studies : - - - -
Mid-term exam   1 40 - -
Final exam   - - 1 60
ECTS WORK LOAD TABLE   Number Duration
Course Duration : 15 2
Classroom Work Time : 1 5
Presentations and Seminars : 13 4
Course Internship : - 0
Workshop / Laboratory Applications : - -
Field Studies : - -
Case studies : - -
Projects : - -
Homework : 3 4
Quiz : 3 3
Mid-term exam : 1 25
Final Exam : 1 25
ECTS 5
No COURSE LEARNING OUTCOMES CONTRIBUTION
D.Ö.Ç. 1 1. Student learns optical systems 4
D.Ö.Ç. 2 2. Student learns microscopic techniques 4
D.Ö.Ç. 3 3. Student learns microscopes except for optical microscopes 4
D.Ö.Ç. 4 4. Student learns how to classify the optical systems 4
D.Ö.Ç. 5 5. Student learns how to analyze the surfaces 4
D.Ö.Ç. 6 6. Student learns where and how to use the detectors 3
D.Ö.Ç. 7 7. Student learns the material analysis 4
D.Ö.Ç. 8 8. Student can chose the microscopic techniques based on the need and material. 3
D.Ö.Ç. 9 9. Student can comment on images taken with different microscopic techniques 3
D.Ö.Ç. 10 10. Student can make analysis at nanometric scale 4
* 1: Zayıf - 2: Orta - 3: İyi - 4: Çok İyi
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